Maize Leaf Disease Severity Analysis using Integrated Color Filtering and Threshold Masking
C.Mohanapriya, , Asst. Prof, Tiruppur Kumaran College for Women , Tirupur , (Tamil Nadu), India.
P.R. Tamilselvi, Asst. Prof, Govt. Arts and Science college ,Komarapalayam , (Tamil Nadu), India.
Manuscript received on 01 August 2019. | Revised Manuscript received on 07 August 2019. | Manuscript published on 30 September 2019. | PP: 5863-5871 | Volume-8 Issue-3 September 2019 | Retrieval Number: C5096098319/2019©BEIESP | DOI: 10.35940/ijrte.C5096.098319
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© The Authors. Blue Eyes Intelligence Engineering and Sciences Publication (BEIESP). This is an open access article under the CC-BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/)
Abstract: As the color is a dominant factor for isolation of the diseased part of corn maize, the detachment of disease affected parts in maize plant leaf is achieved using integrated Color Filtering followed by a threshold masking. The Particular HSV from a color image of maize plant is extracted .Major steps involved here is to initially convert an RGB image of disease affected maize plant to HSV and second is to apply a threshold mask to filter out the green color of healthy maize plant and detach the brown and yellow diseased area thereof. This method is applied and tested with around 30 maize leaves, and the results found that the proposed methodology performs well with overlapped healthy maize leaf compared to K-means Clustering algorithm. False Positive is produced in K-means method and this Proposed system as integrates with Color Filtering and thresholding works well with overlapped images so that it increases True negative as the Accuracy of the proposed method increases. This proposed methodology identifies well with perfect maize leaf images and misclassifications occur only with images with dark shadows, light illuminations and sanded background.
Keywords: HSV, RGB, Color-Filter , Threshold, Cerpospora , NLB(Northern Leaf Blight), Common Rust
Scope of the Article: Image analysis and Processing