Qualification of Operational Amplifier used in Satellite Subsystem using Picosecond Pulsed Laser System
Amira H. Hussein1, Dalia Elfiky2
1Amira Hamdy Space Environment, Egyptian Space Agency, Cairo, Egypt.
2Dalia Elfiky*, Space Science Department, National Authority for Remote Sensing and Space Science, Cairo, Egypt.
Manuscript received on May 25, 2020. | Revised Manuscript received on June 29, 2020. | Manuscript published on July 30, 2020. | PP: 523-527 | Volume-9 Issue-2, July 2020. | Retrieval Number: B3689079220/2020©BEIESP | DOI: 10.35940/ijrte.B3689.079220
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© The Authors. Blue Eyes Intelligence Engineering and Sciences Publication (BEIESP). This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/)
Abstract: Picosecond Pulsed Laser System (PPLS) was used to simulate the single event effects (SEE) on satellite electronic components. Single event transients effect induced in an operational amplifier (LM324) to determine how transient amplitude and charge collection varied with pulsed laser energies. The wavelength and the focused spot size are the primary factors generating the resultant charge density profile. The degradation performance of LM324 induced by pulsed laser irradiation with two wavelength (1064nm, 532nm) is determined as a function of laser cross section. The transient voltage changed due to pulsed laser hitting specific transistors. This research shows the sensitivity mapping of LM324 under the effect of fundamental and second harmonic wavelengths. Determine the threshold energy of the SET in both wavelength, and compare the laser cross section of 1064 nm beam and 532 nm beam.
Keywords: Pulsed Laser Single Event Effect System, Single Event Transient, operational amplifier.